"Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom ..."

Dong Xiang, Xiaoqing Wen, Laung-Terng Wang (2017)

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DOI: 10.1109/TVLSI.2016.2606248

access: closed

type: Journal Article

metadata version: 2020-03-11

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Dong Xiang, Xiaoqing Wen, Laung-Terng Wang:
Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 942-953 (2017)

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