Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Built-In Binary Code Inversion Technique for On-Chip Flash Memory Sense ..."

Daejin Park, Tag Gon Kim (2014)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2013.2265894

access: closed

type: Journal Article

metadata version: 2020-03-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/ParkK14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/ParkK14
Daejin Park, Tag Gon Kim:
Built-In Binary Code Inversion Technique for On-Chip Flash Memory Sense Amplifier With Reduced Read Current Consumption. IEEE Trans. Very Large Scale Integr. Syst. 22(5): 1187-1191 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.