"Effective Diagnostic Pattern Generation Strategy for Transition-Delay ..."

Davide Appello et al. (2009)

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DOI: 10.1109/TVLSI.2008.2006177

access: closed

type: Journal Article

metadata version: 2021-07-25

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  - https://dblp.org/rec/journals/tvlsi/AppelloBGSR09
Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. Very Large Scale Integr. Syst. 17(11): 1654-1659 (2009)

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