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"Reliability study of ultrathin oxide films subject to ..."
You-Lin Wu et al. (2007)
- You-Lin Wu, Shi-Tin Lin, Tsung-Min Chang, Juin J. Liou:
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy. Microelectron. Reliab. 47(2-3): 419-421 (2007)
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