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"A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip."

Biswajit Bhowmik et al. (2019)

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DOI: 10.1007/S10836-019-05792-1

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/BhowmikBDB19
Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya:
A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip. J. Electron. Test. 35(2): 215-243 (2019)

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