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"Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology."

Y. Ji et al. (2019)

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DOI: 10.1109/IRPS.2019.8720429

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-20

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  dblp key:
  - conf/irps/JiGLLLUPHSLSLSH19
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  - https://dblp.org/rec/conf/irps/JiGLLLUPHSLSLSH19
Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, Taiki Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S. H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, Gwanhyeob Koh, K. C. Park, Sangwoo Pae, Gi-Tae Jeong, J. S. Yoon, E. S. Jung:
Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. IRPS 2019: 1-3

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