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"A fast spatial variation modeling algorithm for efficient test cost ..."
Hugo R. Gonçalves et al. (2015)
- Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler:
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. DATE 2015: 1042-1047
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