"Optimization of a cycle time and utilization in semiconductor test ..."

Appa Iyer Sivakumar (1999)

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DOI: 10.1109/WSC.1999.823204

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Appa Iyer Sivakumar:
Optimization of a cycle time and utilization in semiconductor test manufacturing using simulation based, on-line, near-real-time scheduling system. WSC 1999: 727-735

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