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"Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate ..."
Manish Sharma, Janak H. Patel, Jeff Rearick (2003)
- Manish Sharma, Janak H. Patel, Jeff Rearick:
Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture. VTS 2003: 15-21
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