"Concurrent autonomous self-test for uncore components in system-on-chips."

Yanjing Li et al. (2010)

Details and statistics

DOI: 10.1109/VTS.2010.5469571

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-05

a service of  Schloss Dagstuhl - Leibniz Center for Informatics