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"A practical approach to instruction-based test generation for functional ..."

Kazumi Hatayama et al. (1997)

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DOI: 10.1109/VTEST.1997.599436

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/HatayamaHMY97
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  persistent URL:
  - https://dblp.org/rec/conf/vts/HatayamaHMY97
Kazumi Hatayama, Kazunori Hikone, Takeshi Miyazaki, Hiromichi Yamada:
A practical approach to instruction-based test generation for functional modules of VLSI processors. VTS 1997: 17-23

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