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"Overcoming Embedded Memory Test & Repair Challenges in the ..."
Artur Ghukasyan et al. (2023)
- Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. VTS 2023: 1-4
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