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"A simulation-based approach to test pattern generation for synchronous ..."

Paolo Camurati et al. (1992)

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DOI: 10.1109/VTEST.1992.232763

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/vts/CamuratiCPR92
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  persistent URL:
  - https://dblp.org/rec/conf/vts/CamuratiCPR92
Paolo Camurati, Fulvio Corno, Fulvio Prinetto, Matteo Sonza Reorda:
A simulation-based approach to test pattern generation for synchronous sequential circuits. VTS 1992: 263-267

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