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"Combined Effect of Grain Boundary Depletion and PolySi/Oxide Interface ..."

R. P. Suresh et al. (1996)

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DOI: 10.1109/ICVD.1996.489476

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/SureshVSP96
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/SureshVSP96
R. P. Suresh, P. Venugopal, S. Tamizh Selvam, S. Potla:
Combined Effect of Grain Boundary Depletion and PolySi/Oxide Interface Depletion on Drain Characteristics of a p-MOSFET. VLSI Design 1996: 156-161

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