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"Input Pattern Classification for Detection of Stuck-ON and Bridging Faults ..."

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana (1997)

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DOI: 10.1109/ICVD.1997.568205

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/MenonMJ97
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/MenonMJ97
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I_DDQ Testing in BiCMOS and CMOS Circuits. VLSI Design 1997: 545-546

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