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"Constraint Driven Pin Mapping for Concurrent SOC Testing."
Yu Huang et al. (2002)
- Yu Huang, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan, Yanping Zhang, Wu-Tung Cheng, Sudhakar M. Reddy:
Constraint Driven Pin Mapping for Concurrent SOC Testing. ASP-DAC/VLSI Design 2002: 511-516
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