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"A robust -40 to 120°C all-digital true random number generator in ..."

Kaiyuan Yang, David T. Blaauw, Dennis Sylvester (2015)

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DOI: 10.1109/VLSIC.2015.7231275

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-02

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Kaiyuan Yang, David T. Blaauw, Dennis Sylvester:
A robust -40 to 120°C all-digital true random number generator in 40nm CMOS. VLSIC 2015: 248-

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