"Analyzing the Reliability of TCUs Through Micro-architecture and ..."

Robert Limas Sierra et al. (2023)

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DOI: 10.1007/978-3-031-70947-0_8

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-31

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Robert Limas Sierra, Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda:
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats. VLSI-SoC (Selected Papers) 2023: 149-176

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