"On the optimized generation of Software-Based Self-Test programs for VLIW ..."

Davide Sabena, Matteo Sonza Reorda, Luca Sterpone (2012)

Details and statistics

DOI: 10.1109/VLSI-SOC.2012.6379018

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-06

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