"Reliability issues in deep deep sub-micron technologies: time-dependent ..."

Antonis Papanikolaou et al. (2006)

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DOI: 10.1109/VLSISOC.2006.313258

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-04

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Antonis Papanikolaou, Miguel Miranda, Hua Wang, Francky Catthoor, M. Satyakiran, Pol Marchal, Ben Kaczer, C. Bruynseraede, Zsolt Tokei:
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. VLSI-SoC 2006: 342-347

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