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"A New Test Generation Model for Broadside Transition Testing of Partial ..."

Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara (2006)

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DOI: 10.1109/VLSISOC.2006.313252

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara:
A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits. VLSI-SoC 2006: 308-313

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