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"Test and evaluation for the minimum gap go through in IEC 62885-7 to ..."

Jaesub Shin et al. (2017)

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DOI: 10.1109/URAI.2017.7992690

access: closed

type: Conference or Workshop Paper

metadata version: 2017-08-21

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Jaesub Shin, Minho Lee, Sun-Young Kang, HyeonSeok Jang:
Test and evaluation for the minimum gap go through in IEC 62885-7 to improve reproducibility. URAI 2017: 632-635

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