"An Approach to Capture Design-induced Error Using an Ontology."

Injae Shin, Sanghee Kim, Chris A. McMahon (2007)

> Home

Details and statistics

DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-03-10

- view
  - electronic edition @ ceur-ws.org (open access)
- export record
  dblp key:
  - conf/semweb/ShinKM07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/semweb/ShinKM07
Injae Shin, Sanghee Kim, Chris A. McMahon:
An Approach to Capture Design-induced Error Using an Ontology. SWW 2.0 2007

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.