"Reducing the Cost of Android Mutation Testing."

Lin Deng, Jeff Offutt (2018)

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DOI: 10.18293/SEKE2018-184

access: open

type: Conference or Workshop Paper

metadata version: 2023-11-06

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  dblp key:
  - conf/seke/DengO18
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  - https://dblp.org/rec/conf/seke/DengO18
Lin Deng, Jeff Offutt:
Reducing the Cost of Android Mutation Testing. SEKE 2018: 542-541

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