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"Encountering gate oxide breakdown with shadow transistors to increase ..."
Claas Cornelius et al. (2008)
- Claas Cornelius, Frank Sill
, Hagen Sämrow, Jakob Salzmann, Dirk Timmermann
, Diógenes Cecilio da Silva Jr.:
Encountering gate oxide breakdown with shadow transistors to increase reliability. SBCCI 2008: 111-116
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