"An evolutionary algorithm for reducing integrated-circuit test application ..."

Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero (2002)

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DOI: 10.1145/508791.508908

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero:
An evolutionary algorithm for reducing integrated-circuit test application time. SAC 2002: 608-612

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