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"Automatic test data generation using particle systems."

Paulo Marcos Siqueira Bueno, W. Eric Wong, Mário Jino (2008)

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DOI: 10.1145/1363686.1363871

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-08

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Paulo Marcos Siqueira Bueno, W. Eric Wong, Mário Jino:
Automatic test data generation using particle systems. SAC 2008: 809-814

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