"A novel multi-direction high shock reliability test on MEMS devices."

Wenzhong Lou et al. (2009)

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DOI: 10.1109/NEMS.2009.5068573

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/nems/LouSLLLL09
Wenzhong Lou, Renlong Song, Yunjian Liu, Xiaosong Liu, Weihua Li, Wanfeng Lin:
A novel multi-direction high shock reliability test on MEMS devices. NEMS 2009: 261-264

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