"Metric forensics: a multi-level approach for mining volatile graphs."

Keith Henderson et al. (2010)

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DOI: 10.1145/1835804.1835828

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/kdd/HendersonEFALMPT10
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  - https://dblp.org/rec/conf/kdd/HendersonEFALMPT10
Keith Henderson, Tina Eliassi-Rad, Christos Faloutsos, Leman Akoglu, Lei Li, Koji Maruhashi, B. Aditya Prakash, Hanghang Tong:
Metric forensics: a multi-level approach for mining volatile graphs. KDD 2010: 163-172

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