"X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST ..."

Peter Wohl et al. (2003)

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DOI: 10.1109/TEST.2003.1270902

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin:
X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture. ITC 2003: 727-736

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