"Semiconductor manufacturing process monitoring using built-in self-test ..."

Ivo Schanstra et al. (1998)

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DOI: 10.1109/TEST.1998.743277

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ivo Schanstra, Dharmajaya Lukita, Ad J. van de Goor, Kees Veelenturf, Paul J. van Wijnen:
Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. ITC 1998: 872-881

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