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"Defect detection with transient current testing and its potential for deep ..."

Manoj Sachdev, Peter Janssen, Victor Zieren (1998)

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DOI: 10.1109/TEST.1998.743153

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/SachdevJZ98
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  persistent URL:
  - https://dblp.org/rec/conf/itc/SachdevJZ98
Manoj Sachdev, Peter Janssen, Victor Zieren:
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. ITC 1998: 204

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