"High volume microprocessor test escapes, an analysis of defects our tests ..."

Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong (1998)

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DOI: 10.1109/TEST.1998.743133

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong:
High volume microprocessor test escapes, an analysis of defects our tests are missing. ITC 1998: 25-34

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