"Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room ..."

Francesco Lorenzelli et al. (2023)

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DOI: 10.1109/ITC51656.2023.00031

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen:
Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures. ITC 2023: 151-158

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