"Two-Pattern Test Capabilities of Autonomous TPG Circuits."

Kiyoshi Furuya, Edward J. McCluskey (1991)

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DOI: 10.1109/TEST.1991.519735

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Kiyoshi Furuya, Edward J. McCluskey:
Two-Pattern Test Capabilities of Autonomous TPG Circuits. ITC 1991: 704-711

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