"Model Checker Aided Design of a Controller for a Wafer Scanner."

Martijn Hendriks, Barend van den Nieuwelaar, Frits W. Vaandrager (2004)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2008-09-11

- no documents available
- export record
  dblp key:
  - conf/isola/HendriksNV04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isola/HendriksNV04
Martijn Hendriks, Barend van den Nieuwelaar, Frits W. Vaandrager:
Model Checker Aided Design of a Controller for a Wafer Scanner. ISoLA (Preliminary proceedings) 2004: 201-208

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.