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"Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits ..."

Hyunggoy Oh et al. (2018)

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DOI: 10.1109/ISOCC.2018.8649911

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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Hyunggoy Oh, Heetae Kim, Sangjun Lee, Sungho Kang:
Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test. ISOCC 2018: 7-8

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