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"A selective error data capture method using on-chip DRAM for silicon debug ..."

Hyunggoy Oh et al. (2017)

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DOI: 10.1109/ISOCC.2017.8368799

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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  dblp key:
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Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
A selective error data capture method using on-chip DRAM for silicon debug of multi-core design. ISOCC 2017: 121-122

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