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"Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level ..."
Bon Woong Ku et al. (2016)
- Bon Woong Ku, Peter Debacker, Dragomir Milojevic
, Praveen Raghavan, Diederik Verkest, Aaron Thean, Sung Kyu Lim
:
Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level Monolithic 3D ICs. ISLPED 2016: 76-81
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