"A framework to study time-dependent variability in circuits at sub-35nm ..."

Tong Boon Tang et al. (2012)

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DOI: 10.1109/ISCAS.2012.6271551

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-29

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Tong Boon Tang, Alan F. Murray, Binjie Cheng, Asen Asenov:
A framework to study time-dependent variability in circuits at sub-35nm technology nodes. ISCAS 2012: 1568-1571

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