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"Test pattern generation for multiple stuck-at faults not covered by test ..."

Conrad J. Moore et al. (2017)

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DOI: 10.1109/ISCAS.2017.8050913

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Conrad J. Moore, Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita:
Test pattern generation for multiple stuck-at faults not covered by test patterns for single faults. ISCAS 2017: 1-4

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