"Total Ionizing Dose (TID) effects on finger transistors in a 65nm CMOS ..."

Jize Jiang et al. (2016)

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DOI: 10.1109/ISCAS.2016.7527156

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type: Conference or Workshop Paper

metadata version: 2023-03-27

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Jize Jiang, Wei Shu, Kwen-Siong Chong, Tong Lin, Ne Kyaw Zwa Lwin, Joseph Sylvester Chang, Jingyuan Liu:
Total Ionizing Dose (TID) effects on finger transistors in a 65nm CMOS process. ISCAS 2016: 5-8

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