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"Extraction of Fowler-Nordheim parameters of thin SiO2 oxide ..."
Nadia Harabech et al. (2000)
- Nadia Harabech, Rachid Bouchakour, Pierre Canet, Philippe Pannier, Jean-Pierre Sorbier:
Extraction of Fowler-Nordheim parameters of thin SiO2 oxide film including polysilicon gate depletion: validation with an EEPROM memory cell. ISCAS 2000: 441-444
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