"A secure scan chain test scheme exploiting retention loss of memristors."

Yanping Gong, Fengyu Qian, Lei Wang (2017)

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DOI: 10.1109/ISCAS.2017.8050911

access: closed

type: Conference or Workshop Paper

metadata version: 2017-10-07

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Yanping Gong, Fengyu Qian, Lei Wang:
A secure scan chain test scheme exploiting retention loss of memristors. ISCAS 2017: 1-4

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