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"A retiming-based test pattern generator design for built-in self test of ..."
Aiman H. El-Maleh, Yahya E. Osais (2001)
- Aiman H. El-Maleh, Yahya E. Osais:
A retiming-based test pattern generator design for built-in self test of data path architectures. ISCAS (4) 2001: 550-553
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