"A low cost method for testing offset and gain error for ADC BIST."

Jingbo Duan, Degang Chen, Randall L. Geiger (2012)

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DOI: 10.1109/ISCAS.2012.6271677

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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Jingbo Duan, Degang Chen, Randall L. Geiger:
A low cost method for testing offset and gain error for ADC BIST. ISCAS 2012: 2023-2026

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