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"Experimental analysis of buried SiGe pMOSFETs from the perspective of ..."
Felice Crupi et al. (2011)
- Felice Crupi, Massimo Alioto, Jacopo Franco
, Paolo Magnone
, Ben Kaczer, Guido Groeseneken
, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann:
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. ISCAS 2011: 2249-2252

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