"Employing transistor reliability testing as an FA tool for understanding ..."

Abdullah Yassine, Lauren Blair, Wayland Seifert (2015)

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DOI: 10.1109/IRPS.2015.7112802

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Abdullah Yassine, Lauren Blair, Wayland Seifert:
Employing transistor reliability testing as an FA tool for understanding HTOL product BIST failures. IRPS 2015: 4

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