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"Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node."
Lyuan Xu et al. (2020)
- Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS 2020: 1-5
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