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ORCIDChristopher Frost 0002
Person information
- affiliation: Rutherford Appleton Laboratory, ISIS, Didcot, UK
Other persons with the same name
- Christopher Frost 0001 — Samsara (and 2 more)
- Chris Frost — disambiguation page
- Chris Frost 0001
![[0000-0003-0098-9915]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0003-0098-9915")
— London School of Hygiene and Tropical Medicine, Department of Medical Statistics, UK (and 1 more)
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2020 – today
- 2024
[j5]Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost:
Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation. IEEE Trans. Reliab. 73(1): 771-783 (2024)- 2023
- [i3]Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost:
Single Event Effects Assessment of UltraScale+ MPSoC Systems under Atmospheric Radiation. CoRR abs/2303.08098 (2023) - [i2]Paolo Branchini, Andrea Fabbri, Sacha Cormenier, Marco Bernardini, Giovanni Romanelli, Enrico Preziosi, Roberto Senesi, Carla Andreani, Chris Frost, Carlo Cazzaniga, Toni Fabio Catalano, Mario Buffardo:
Irradiation Tests for Commercial Off-the Shelf Components with Atmospheric-like Neutrons and Heavy-Ions. CoRR abs/2311.17665 (2023) - 2021
- [j4]Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost:
First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. IEEE Trans. Emerg. Top. Comput. 9(1): 104-108 (2021) - [j3]Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Andrea Favalli, Opale Schappert, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Paolo Rech:
Thermal neutrons: a possible threat for supercomputer reliability. J. Supercomput. 77(2): 1612-1634 (2021) - [i1]Fernando Fernandes dos Santos, Sujit Malde, Carlo Cazzaniga, Christopher Frost, Luigi Carro, Paolo Rech:
Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs. CoRR abs/2108.00554 (2021) - 2020
- [c9]Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fermando Santos, Gabriel Piscoya Dávila, Philippe Olivier Alexandre Navaux, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech:
An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices. DSN (Supplements) 2020: 92-97 - [c8]Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech:
Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. ETS 2020: 1-6 - [c7]Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS 2020: 1-5
2010 – 2019
- 2015
- [c6]Lucas A. Tambara, Felipe Almeida, Paolo Rech, Fernanda Lima Kastensmidt, Giovanni Bruni, Christopher Frost:
Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects. ARC 2015: 331-338 - 2014
- [j2]Paolo Rech, Christopher Frost, Luigi Carro:
GPUs Neutron Sensitivity Dependence on Data Type. J. Electron. Test. 30(3): 307-316 (2014) - [j1]Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost:
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs. Microelectron. Reliab. 54(9-10): 2344-2348 (2014) - [c5]Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Christopher Frost:
Decreasing FIT with diverse triple modular redundancy in SRAM-based FPGAs. DFT 2014: 153-158 - [c4]Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost:
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. ETS 2014: 1-2 - 2013
- [c3]Paolo Rech, Caroline Aguiar, Christopher Frost, Luigi Carro:
Experimental evaluation of thread distribution effects on multiple output errors in GPUs. ETS 2013: 1-6 - [c2]Paolo Rech, Caroline Aguiar, Christopher Frost, Luigi Carro:
Neutron sensitivity of integer and floating point operations executed in GPUs. LATW 2013: 1-6 - 2012
- [c1]Paolo Rech, Caroline Aguiar, Ronaldo Rodrigues Ferreira, Christopher Frost, Luigi Carro:
Neutron radiation test of graphic processing units. IOLTS 2012: 55-60
Coauthor Index
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